Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements

Stelzer, Bastian (Corresponding author); Chen, Xiang; Bliem, Pascal; Hans, Marcus; Völker, Bernhard; Sahu, Rajib; Scheu, Christina; Primetzhofer, Daniel; Schneider, Jochen M.

London] : Macmillan Publishers Limited, part of Springer Nature (2019)
Journal Article

In: Scientific reports
Volume: 9
Page(s)/Article-Nr.: 8266