Structure and mechanical properties of TiAlN-WNx thin films

Reeswinkel, Thomas; Sangiovanni, Davide Giuseppe; Chirita, Valeriu; Hultman, Lars; Schneider, Jochen M.

Lausanne : Elsevier Sequoia (2011)
Journal Article

In: Surface & coatings technology
Volume: 205
Issue: 20
Page(s)/Article-Nr.: 4821-4827

Identifier