Growth and thermal stability of (V,Al)2 Cx thin films

Jiang, Yan; Iskandar, Riza; to Baben, Moritz; Takahashi, Tetsuya; Zhang, Jie; Emmerlich, Jens; Mayer, Joachim; Polzer, Conrad; Polcik, Peter; Schneider, Jochen M.

Warrendale, Pa : Materials Research Soc. (2012)
Journal Article

In: Journal of materials research : JMR
Volume: 27
Issue: 19
Page(s)/Article-Nr.: 2511-2519

Identifier