Composition spread analysis of phase change dynamics in GexSByTe1-x-y films embedded in an optical multi-layer stack
Laurenzis, Martin; Heinrici, A.; Haring Bolívar, Peter; Kurz, Heinrich; Kyrsta, Stepan; Schneider, Jochen M.
London : IEE (2004)
Journal Article
In: IEE proceedings / Science, measurement & technology
Volume: 151
Issue: 6
Page(s)/Article-Nr.: 394-397
Identifier
- DOI: 10.1049/ip-smt:20041082
- RWTH PUBLICATIONS: RWTH-CONV-026023