Strength degradation mechanisms in h-BN/NiAl coated sapphire fibres with a reactive Hf or Y interlayer

Hajas, David E.; Kyrsta, Stepan; Richter, Silvia; Mayer, Joachim; Schneider, Jochen M.

Amsterdam [u.a.] : Elsevier (2008)
Journal Article

In: Materials science & engineering / A, Structural materials: properties, microstructure and processing
Volume: 491
Issue: 1/2
Page(s)/Article-Nr.: 207-213

Institutions

  • Central Facility for Electron Microscopy [025000]
  • Chair of Microstructure Analysis [025010]
  • Chair of Materials Chemistry [521110]
  • Division of Materials Science and Engineering [520000]
  • Department of Physics [130000]

Identifier