Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements

Stelzer, Bastian (Corresponding author); Chen, Xiang; Bliem, Pascal; Hans, Marcus; Völker, Bernhard; Sahu, Rajib; Scheu, Christina; Primetzhofer, Daniel; Schneider, Jochen M.

London] : Macmillan Publishers Limited, part of Springer Nature (2019)
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In: Scientific reports
Band: 9
Seite(n)/Artikel-Nr.: 8266

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